Prevention of film deposition on pecvd process chamber wall
AssigneeApplied Materials, Inc.
InventorsBeom Soo Park, Robin L. Tiner, Soo Young Choi, John M. White
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AssigneeApplied Materials, Inc.
InventorsBeom Soo Park, Robin L. Tiner, Soo Young Choi, John M. White
Estimating the term…
A method and apparatus for processing a substrate are provided. The chamber body comprises a chamber bottom and a sidewall having a slit valve. A substrate support comprising a support body is disposed in the chamber body. A first end of at least one wide RF ground strap is coupled with the support body and a second end of at least one RF ground strap is coupled with the chamber bottom. At least one extension bar is positioned along a peripheral edge of the support body. The method comprises providing a processing chamber having a slit valve and a substrate support, providing RF power to a distribution plate disposed over the substrate support, flowing gas through the distribution plate, plasma processing a substrate disposed on the substrate support, and reducing the generation of plasma adjacent to the slit valve.
A substrate processing chamber, comprising:
A substrate processing chamber, comprising:
A substrate processing chamber, comprising:
A method of processing a substrate, comprising:
The method of claim 24, wherein a distance between at least a portion of the wide RF ground strap and the slit valve is less than a distance between the substrate support and the slit valve.
Dependencies are inferred from the claim text.