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US 2008/0186608 A1Published application
Method of testing a magnetic head
AssigneeFujitsu Limited
InventorHisato Arai
Life of this patent
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Abstract
A method of testing tests a magnetic head including a read element, a write element, and a predetermined electrical circuit. A magnetic signal on a magnetic recording medium is read using the read element in a state where the read element is subjected to noise due to electrical waves and an electric field induced by applying an AC bias voltage to the electrical circuit, and the output signal outputted by the read element is evaluated.
Claims7
A method of testing a magnetic head including a read element, a write element, and a predetermined electrical circuit, the method comprising steps of:
- applying an AC voltage to the electrical circuit;
- and
- evaluating an output signal of the read element in a state where the AC voltage is applied.
Dependencies are inferred from the claim text.