US 2008/0186038 A1 · ELECTRICAL TEST PROBE AND METHOD FOR MANUFACTURING THE SAME

Abstract

A probe tip section of an electrical test probe has a laminated structure consisting of a first deposition portion and a second deposition portion covering the first deposition portion, and by the laminated structure, a maximum cross-sectional area portion at which the cross-sectional area of the probe tip section is increased to a base portion is provided between a tip end of the probe tip section and the base portion in the probe tip section. At the maximum cross-sectional area portion, a dimension in the X direction as seen on a flat surface perpendicular to a protruding direction of the probe tip section is increased in a one-dimensional way, and in addition, a dimension in the Y direction perpendicular to the X direction is increased from the tip end toward the base portion, as a result of which the cross-sectional area of the probe tip section can be increased in a two-dimensional way. Thus, the cross-sectional area at the maximum cross-sectional area portion reaching the base portion of the probe tip section can be made to be larger than in the conventional case, and along with the increase of the cross-sectional area, the stress acting on the base portion can be lowered.

Claims10

Dependent claims

An electrical test probe comprising:

a probe tip section;
and
a probe main body section having a pedestal portion on which said probe tip section is formed to be protruded,
wherein said probe main body section is formed by deposition of a conductive material that is greater in toughness than said probe tip section, and said probe tip section is formed by deposition of a conductive material that is higher in hardness than the material of said probe main body section, and
wherein said probe tip section is formed with its base portion buried in said pedestal portion, said probe tip section has a laminated structure consisting of a first deposition portion and a second deposition portion covering said first deposition portion, by said laminated structure, a maximum cross-sectional area portion at which the cross-sectional area of said probe tip section is increased to said base portion is provided between a tip end of said probe tip section and said base portion in said probe tip section, and at said maximum cross-sectional area portion, both a dimension in the X direction as seen on a flat surface perpendicular to a protruding direction of said probe tip section and a dimension in the Y direction perpendicular to said X direction are increased from said tip end toward said base portion.

2 more elements

A method for manufacturing a probe comprising a probe tip section and a probe main body section having a pedestal portion on which said probe tip section is formed to be protruded, said method comprising the step of:

after depositing a metal material on a base table to form a first deposition portion for said probe tip section, forming a second deposition portion entirely covering said first deposition portion,
wherein combination of said first deposition portion and said second deposition portion causes increase of the thickness dimension of said probe tip section along the deposition direction of the metal material for said probe tip section.

Dependencies are inferred from the claim text.

Electrical test probe and method for manufacturing the same

Life of this patent

Electrical test probe and method for manufacturing the same

Life of this patent

Abstract

Claims10