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US 2008/0186037 A1Published application
Probe card and structure for fixing needle thereof
AssigneeWilltechnology Co., Ltd.
InventorKi Don Ko
Life of this patent
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Abstract
A probe card having a simple structure and an easy manufacturing process is disclosed. The probe card includes an upper structure having a probe circuit pattern, and a needle having an elastic bending portion, a tip portion extending from a lower end of the elastic bending portion, and a connection portion extending from an upper end of the elastic bending portion and connected electrically to the probe circuit pattern. Here, a portion of the elastic bending portion is received in the upper structure.
Claims14
A probe card comprising:
- an upper structure including a probe circuit pattern;
- and
- a needle including an elastic bending portion, a tip portion extending from a lower end of the elastic bending portion, and a connection portion extending from an upper end of the elastic bending portion and connected electrically to the probe circuit pattern,
- wherein at least a part of the elastic bending portion is received in the upper structure.
1 more element
A structure for fixing a needle of a probe card comprising:
- an upper structure including a probe circuit pattern;
- a connection plate located below the upper structure and including a needle fixing groove formed on a lower surface thereof;
- and
- the needle including an elastic bending portion, a tip portion extending from a lower end of the elastic bending portion, and a connection portion extending from an upper end of the elastic bending portion and connected electrically to the probe circuit pattern,
- wherein a distance between a outmost portion of the elastic bending portion and an tip portion axis is greater than a distance between the outmost portion of the elastic bending portion and an axis corresponding to the connection portion.
2 more elements
Dependencies are inferred from the claim text.