High Speed Electrical Probe
OwnerBrian Shumakerinventor
Life of this patent
Estimating the term…
Abstract
A high speed probe is configured with a diamond-gold plated tip to facilitate high speed test operations. A die is used to adjust the probe tips in a predetermined shape configuration.
Claims20
A probe system comprising:
- an elongate pair of conductors running substantially parallel to one through their length,
- insulation that separates the conductors from one another;
- the insulation being removed from one end of the pair of conductors to present a probe tip area having a pair of probe tips;
- the probe tips being adjusted to a predetermined shape by the action of a die;
- a pair of connectors each adapted to communicate with a corresponding one of the conductors from the pair of conductors, the pair of conductors being constructed and arranged to permit the attachment of cabling to the connectors for the conduct of test operations through use of the probe.
The probe system of claim 4, the paired holes being further constructed and arranged to planarize the probe tips for a predetermined angle of presentation of the probe tips to a test article.
The probe system of clam 1 wherein the test electronics are configured to perform test calculations on a signal cycle speed of at least thirty GHz.
A method of testing an electrical circuit through use of a probe system that contains
- an elongate pair of conductors running substantially parallel to one through their length,
- insulation that separates the conductors from one another;
- the insulation being removed from one end of the pair of conductors to present a probe tip area having a pair of probe tips;
- the probe tips being adjusted to a predetermined shape by the action of a die;
- a pair of connectors each adapted to communicate with a corresponding one of the conductors from the pair of conductors, the pair of conductors being constructed and arranged to permit the attachment of cabling to the connectors for the conduct of test operations through use of the probe,
- the method comprising the steps of:
- adjusting the probe tips by the use of a die to impart a predetermined shape configuration thereto;
- contacting an electrical circuit with the probe tip area;
- receiving a signal from the probe tip area;
- and
- performing an analysis of the signal to represent performance of the electrical circuit.
The method of clam 13 wherein the test electronics are configured to perform test calculations on a signal cycle speed of at least thirty GHz.
Dependencies are inferred from the claim text.