Semiconductor device and method of fabricating the same
AssigneeSanyo Electric Co., Ltd.
InventorsYoshikazu YAMAOKA, Satoru Shimada, Kazunori Fujita, Kazuhiro Sasada
Life of this patent
Estimating the term…
Loading patent…
AssigneeSanyo Electric Co., Ltd.
InventorsYoshikazu YAMAOKA, Satoru Shimada, Kazunori Fujita, Kazuhiro Sasada
Estimating the term…
A semiconductor device capable of inhibiting a fabricating process from complication while inhibiting the dielectric strength voltage of a insulating film from reduction is obtained. This semiconductor device includes a groove portion, an insulating film formed on a surface of the groove portion, a gate electrode and a source impurity region, wherein upper ends of the gate electrode, which are portions in contact with the insulating film, are each located at a position identical with or deeper than the range of an impurity introduced from a surface of a semiconductor substrate with respect to the insulating film in order to form the source impurity region and above a lower surface of the source impurity region.
A semiconductor device comprising:
A method of fabricating a semiconductor device, comprising steps of:
Dependencies are inferred from the claim text.