Photothermal Inspection Camera Having an Offset Adjusting Device
AssigneeAreva Np
InventorsMarc Piriou, Laurent Legrandjacques
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AssigneeAreva Np
InventorsMarc Piriou, Laurent Legrandjacques
Estimating the term…
This photothermal examination camera (16) comprises: a system (22) for shaping a laser beam (4), which includes a device (40) for elongating the cross section of the beam in order to form, on a surface of a part (1) to be examined, an elongate heating zone along a direction; a matrix (8) of infrared detectors for detecting infrared radiation emitted by a detection zone on the surface (1a) of the part (1) relative to the heating zone; and a signal processing unit (46) for processing the signals delivered by the infrared detectors in order to construct a thermographic image of the surface (1a) of the part (1) by scanning the surface (1a) with the heating zone. The camera includes a system for mechanically adjusting an offset between the elongate heating zone and the detection zone. Application to the non-destructive inspection of parts.
Photothermal examination camera (16), of the type that comprises:
Dependencies are inferred from the claim text.