Micrometer-based measuring system and method of using same

A method for measuring, comprising the steps of:

• providing a linear measuring system, the measuring system including a measuring instrument and a processing device;
• inputting reference data into the processing device;
• measuring a workpiece using the measuring instrument so as to gain a testing dimension;
• and
• using the processing device to determine a relation between the testing dimension and the reference data so as to yield a testing result.

A measuring system, comprising:

• a linear measuring instrument including a base, a guide column, and a measuring assembly, the measuring assembly attached to the guide column, the measuring assembly including a digital micrometer moveably positioned above the base;
• and
• a processing device electronically connected with the digital micrometer;
• wherein the processing device receives a measured value from the digital micrometer and displays a testing result after processing the measured value.