Operating method of p-channel non-volatile memory

A method of operating a P-channel non-volatile memory, the P-channel non-volatile memory comprising a substrate, an N-well disposed in the substrate and a serially connected first memory cell and second memory cell disposed over the N-well, such that a second doped region is share by the first memory cell and the second memory cell, and each memory cell comprising a gate disposed over the substrate, a charge storage structure disposed between the substrate and the gate, and a first doped region and a third doped region disposed in the substrate on respective sides of the gate;

• the operating method comprising:
• performing a programming operation to the first memory cell of the P-channel non-volatile memory by applying a first voltage to the first doped region of the first memory cell, applying a second voltage to the gate of the first memory cell, applying a third voltage to the gate of the second memory cell, opening up the channel underneath the second memory cell, applying a fourth voltage to the third doped region of the second memory cell, and applying a fifth voltage to the N-well, wherein the fourth voltage is higher than the first voltage, and the fourth voltage is higher than the second voltage so that a channel hot hole induced hot electron injection effect is triggered to program the first memory cell.