Ald apparatus and method for depositing multiple layers using the same
AssigneeASM Genitech Korea Ltd.
InventorWonyong Koh
Life of this patent
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AssigneeASM Genitech Korea Ltd.
InventorWonyong Koh
Estimating the term…
ALD apparatuses and methods of depositing multiple layers employ a plurality of reaction spaces. The reaction chamber includes inlets configured to introduce reactant gases sufficient to achieve a first ALD process into a first set of the reaction spaces for a first period of time such that the reactant gases are not mixed one another. The ALD apparatus further includes a driver configured to move the substrates through all of the of reaction spaces in a plurality of cycles during the first period such that a first thin film is deposited by space-divided ALD on each of the substrates. Other inlets introduce reactant gases sufficient to achieve a second ALD process into a second set of the reaction spaces for a second period of time, while purge gas is fed to the first set of reaction spaces. The driver moves the substrates through all of the reaction spaces in a plurality of cycles during the second period such that a second thin film of a different composition from the first film is deposited by space-divided ALD on each of the substrates. Additional sets of reaction spaces can be added for third, fourth, etc. ALD processes. The configuration of the ALD apparatus permits deposition of nanolaminate films on a plurality of substrates for a relatively short period of time while preventing undesired deposition by reaction between the reactant gases.
An atomic layer deposition (ALD) apparatus comprising:
An atomic layer deposition (ALD) apparatus configured for depositing multiple layers on multiple substrates, comprising:
A method of forming thin films on a plurality of substrates, the method comprising:
A method of depositing a plurality of thin films on a substrate, the method comprising:
Dependencies are inferred from the claim text.