Methods and systems for protection from over-stress
AssigneeInfineon Technologies AG
InventorsRobert Carl Beier, Raymond Joseph Notarantonio
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Abstract
One embodiment of the invention relates to a circuit for over-stress protection. The circuit includes a temperature rate sensor configured to monitor the temperature of a semiconductor device during a first state. The circuit is further configured to selectively switch the semiconductor device from the first state to a second state if the temperature increases at a rate that has a predetermined relationship with a temperature rate function. Other methods and systems are also disclosed.
Claims24
A circuit, comprising:
- a temperature rate sensor configured to monitor the temperature of a semiconductor device during a first state and selectively switch the semiconductor device from the first state to a second state if the temperature increases at a rate that has a predetermined relationship with a temperature rate function.
A circuit for protection from over-stress, comprising:
- a temperature rate sensor configured to monitor a temperature of a semiconductor device and integrate the temperature during an integration period;
- wherein the integration period relates to a time at which the rate of temperature increase has a pre-determined relationship with a temperature rate function.
A method for protecting a semiconductor device from over-stress, comprising:
- monitoring the temperature of a semiconductor device during an on-state;
- comparing a temperature rate associated with the monitored temperature to a temperature rate function to facilitate switching the semiconductor device from the on-state to an off-state.
A method for protecting a semiconductor device from over-temperature, comprising:
- monitoring a temperature change of the semiconductor device due to flyback energy associated with turning off an inductive load;
- providing a diagnostic flag if the temperature change has a predetermined relationship with a temperature function.
A circuit for protection from over-stress, comprising:
- means for monitoring the temperature of a semiconductor device during an on-state and for comparing a temperature rate associated with the monitored temperature to a temperature rate function;
- and
- circuitry to facilitate switching the semiconductor device from a first state to a second state if the temperature rate favorably compares to the temperature rate function.
Dependencies are inferred from the claim text.