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US 2008/0073548 A1Published application
Method and apparatus for simultaneous detection and measurement of charged particles at one or more levels of particle flux for analysis of same
AssigneeBattelle Memorial Institute
InventorsM. Bonner Denton, Roger Sperline, David W. Koppenaal, Charles J. Barinaga, Gary Hieftje, James H. Barnes, Eugene Atlas
Life of this patent
Estimating the term…