Metrology instruments
AssigneeRenishaw PLC
InventorsStephen Hunter, Hugo Derrick, David McMurthy
Life of this patent
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Abstract
A metrology instrument, such as a probe, probe head, stylus or stylus arm, for mounting on a coordinate position apparatus. The metrology instrument is at least partially constructed from at least one sheet of thermally stable metallic material which is folded to form a three dimensional structure. The at least one sheet of thermally stable material is utilised in the metrology loop of the metrology instrument.
Claims25
A metrology instrument for mounting on a coordinate position apparatus, the metrology instrument being at least partially constructed from at least one sheet of thermally stable metallic material which is folded to form a three dimensional structure, the at least one sheet of thermally stable material being utilised in the metrology loop of the metrology instrument.
A method of manufacture of a metrology instrument comprising:
- providing at least one template of the metrology instrument from a sheet of thermally stable metallic material;
- folding the at least one template to produce the metrology instrument.
A probe head for mounting on a coordinate position apparatus, wherein a structure comprising at least one sheet of thermally stable material is located within the metrology loop between a fixed surface of the probe head and the arm of the coordinate positioning apparatus.
Dependencies are inferred from the claim text.