Method and system for an on-chip AC self-test controller

Abstract

An exemplary embodiment of the present invention is a method for performing AC self-test on an integrated circuit that includes a system clock for use during normal operation. The method comprises applying a long data capture pulse to a first test register in response to said system clock. An at speed data launch pulse is applied to the first test register in response to said system clock. The data from the first register is input to a logic path in response to applying the at speed data launch pulse to the first test register. An at speed data capture pulse is applied to a second test register in response to the system clock. The output from the logic path is input to the second test register in response to applying the at speed data capture pulse to the second test register. A long data launch pulse is applied to the second test register in response to the system clock. An additional embodiment includes a system for performing AC self-test on an integrated circuit that includes a system clock.

Dependencies are inferred from the claim text.