Surge voltage protection diode and method of forming the same
AssigneeFuji Electric Device Technology Co., Ltd.
InventorsNaoki Kumagai, Hiroshi Kanemaru, Yuiichi Harada, Yoshihiro Ikura, Ryuu Saitou
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AssigneeFuji Electric Device Technology Co., Ltd.
InventorsNaoki Kumagai, Hiroshi Kanemaru, Yuiichi Harada, Yoshihiro Ikura, Ryuu Saitou
Estimating the term…
To prevent the destruction of a semiconductor element due to negative resistance, and to reduce the dynamic resistance of a static electricity prevention diode, the ratio of the maximum electric field intensity during an avalanche and the average electric field in a strong electric field region, as well as the impurity density gradient in the vicinity of the strong electric field region are optimized. During avalanche breakdown, a depletion layer is formed across the entire high resistivity region, and its average electric field is kept to ½ or more of the maximum electric field intensity. The density gradients (the depths and impurity densities) of a p+ region and of an n+ region that form a p-n junction of the diode are controlled so that the density gradient in the neighborhood of the high resistivity region does not have negative resistance with respect to increase of the avalanche current.
A vertical surge voltage protection diode comprising:
A method of forming a vertical surge voltage protection diode having a p-n junction formed by first or second and third semiconductor regions, the method comprising the steps of:
Dependencies are inferred from the claim text.