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US 2006/0231754 A1Published application
Telegraph signal microscopy device and method
AssigneeThe Regents of the University of California
InventorsKang Wang, Fei Liu
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AssigneeThe Regents of the University of California
InventorsKang Wang, Fei Liu
Estimating the term…
A microscope device includes a probe having a dielectric material with a first side and a second side. First and second electrodes are disposed on the first side of the dielectric material. A nanotube connects the first and second electrodes. A gate electrode is disposed on the second side (e.g., backside) of the dielectric material. The device includes a stage adapted for holding a sample. The stage and probe are moveable with respect to one another such that the sample can be brought in close proximity to the nanotube. The device further includes current measurement circuitry for measuring current (e.g., Random Telegraph Signals) passing through the nanotube. The microscope device is able to identify and characterize single defects on the molecular or atomic scale. The probe device may be combined with spin resonance and/or optical systems such that the detection/mapping/manipulate of single spin and single photon could be achieved.
A microscopy probe comprising:
A microscope device comprising:
A method of detecting defects in a sample comprising:
Dependencies are inferred from the claim text.