Analysis of data from a mass spectrometer
AssigneeNovatia, LLC
InventorsJeffrey Whitney, David Detlefsen, Mark Hail
Life of this patent
Estimating the term…
Abstract
A programmed computer analyzes data from a mass spectrometer. A spectrum corresponding to an unknown sample is perturbed in various ways, and each perturbed spectrum is compared with the spectrum of a known or reference substance. The perturbed spectrum having the highest correlation with the known spectrum, and which is also physically plausible, is considered to be the best fit. The method indicates in what specific ways the unknown sample differs from, or is similar to, the known substance.
Claims7
A method of analyzing data from a mass spectrometer, comprising:
- a) generating a first mass spectrum corresponding to a known sample and a second mass spectrum corresponding to an unknown sample,
- b) applying a plurality of perturbations to said second spectrum so as to derive a plurality of perturbed spectra,
- c) comparing each of said plurality of perturbed spectra to said first mass spectrum, and
- d) choosing one of said perturbed spectra according to its correlation with said first mass spectrum,
- wherein the generating step includes generating a plurality of first and second mass spectra during a period of time, and wherein a second mass spectrum used in step (b) is selected by comparing candidate second mass spectra with a plurality of first mass spectra, and selecting a candidate second mass spectrum which contains components which are not in common with components in said first mass spectra.
A method of analyzing data from a mass spectrometer, comprising:
- a) generating a plurality of first mass spectra corresponding to a known sample during a selected time interval, and a plurality of second mass spectra corresponding to an unknown sample and obtained during said time interval,
- b) comparing candidate second mass spectra with said plurality of first mass spectra, and
- c) selecting for further study, a candidate second mass spectrum which contains components which are not in common with components in said first mass spectra.
A method of analyzing data from a mass spectrometer, comprising:
- a) generating a first mass spectrum corresponding to a known sample and a second mass spectrum corresponding to an unknown sample, wherein the first mass spectrum comprises a graph having a horizontal axis representing masses of components in the known sample, and a vertical axis representing intensity of each component, wherein the second mass spectrum comprises a graph having a horizontal axis representing masses of components in the unknown sample, and a vertical axis representing intensity of each component,
- b) applying a plurality of perturbations to said second spectrum so as to derive a plurality of perturbed spectra, wherein each perturbation comprises a shift, along the horizontal axis, of a position of one of said components,
- c) comparing each of said plurality of perturbed spectra to said first mass spectrum, and
- d) choosing one of said perturbed spectra according to its correlation with said first mass spectrum,
- wherein the generating step includes generating a plurality of first and second mass spectra during a period of time, and wherein a second mass spectrum used in step (b) is selected by comparing candidate second mass spectra with a plurality of first mass spectra, and selecting a candidate second mass spectrum which contains components which are not in common with components in said first mass spectra.
Dependencies are inferred from the claim text.