Inspection method and system using multifrequency phase analysis
AssigneeGeneral Electric Company
InventorsChangting Wang, William Mcknight, Ui Suh, Serkan Ertekin
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AssigneeGeneral Electric Company
InventorsChangting Wang, William Mcknight, Ui Suh, Serkan Ertekin
Estimating the term…
A method for inspecting a part is provided. The method includes applying a number of multifrequency excitation signals to a probe to generate a number of multifrequency response signals for the part being inspected. The method further includes performing a multifrequency phase analysis on the multifrequency response signals to inspect a subsurface of the part. An inspection system is provided and includes an eddy current (EC) probe configured to induce eddy currents in a part. The system further includes an eddy current instrument coupled to the EC probe and configured to apply multifrequency excitation signals to the EC probe to generate multifrequency response signals. The system further includes a processor configured to analyze the multifrequency response signals from the EC instrument by performing a multifrequency phase analysis, to inspect a subsurface of the part.
A method for inspecting a part, the method comprising:
A method for performing subsurface defect inspections using eddy currents, the method comprising:
An inspection system comprising:
A computer-readable medium storing computer instructions for instructing a computer system for performing subsurface defect inspections, the computer instructions comprising:
A computer-readable medium storing computer instructions for instructing a computer system for performing subsurface defect inspections, the computer instructions comprising:
Dependencies are inferred from the claim text.