Anti-fuse circuit for improving reliability and anti-fusing method using the same
OwnerHyung-Sik You, Seouk-Kyu Choi +2inventors
InventorsHyung-Sik You, Seouk-Kyu Choi, Jong-Won Lee, Hyun-Seok Lee
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Abstract
An anti-fuse circuit includes an anti-fuse device and an electric field control unit. The anti-fuse device is formed having a MOS structure including a first junction, a second junction and a gate terminal. The electric field control unit performs a control operation so that an electric field is formed in the anti-fuse device at the time of an anti-fusing operation. Electric fields formed at the first and second junctions of the anti-fuse device are separately controlled, so that breakdown can occur at two points. Further, the gate terminal of the anti-fuse device is implemented in the form of a band-shaped closed circuit.
Claims15
An anti-fuse circuit, comprising:
- an anti-fuse device having a first junction, a second junction and a gate terminal;
- and
- an electric field control unit for performing a control operation wherein an electric field is formed in the anti-fuse device at a time of an anti-fusing operation, the electric field control unit being driven wherein formation of a first electric field between the gate terminal and first junction of the anti-fuse device and formation of a second electric field between the gate terminal and second junction of the anti-fuse device are separately controlled.
An anti-fusing method using an anti-fuse circuit that includes an anti-fuse device formed having a metal oxide semiconductor structure including a first junction, a second junction and a gate terminal, comprising:
- forming a first electric field between the gate terminal and the first junction of the anti-fuse device at a first time point;
- and
- forming a second electric field between the gate terminal and the second junction of the anti-fuse device at a second time point;
- wherein the first and second time points have a predetermined time interval therebetween.
An anti-fuse circuit, comprising:
- an anti-fuse device having a first junction, a second junction and a gate terminal;
- and
- an electric field control unit for performing a control operation wherein an electric field is formed between the first and second junctions of the anti-fuse device at a time of an anti-fusing operation;
- wherein the gate terminal of the anti-fuse device is implemented in the form of a band-shaped closed circuit.
Dependencies are inferred from the claim text.