Systems and methods for facilitating testing of integrated circuits
OwnerJohn Rohrbaugh, Jeffrey Rearickinventors
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OwnerJohn Rohrbaugh, Jeffrey Rearickinventors
Estimating the term…
Systems and methods for testing integrated circuits (ICs) are provided. In this regard, a representative method involves an IC having a first pad configured as a signal interface for components external to the IC, the first pad having a first receiver configured to receive an input signal from a component external to the IC. The method comprises: electrically interconnecting automated test equipment (ATE) with the IC; providing at least one stimulus such that the IC detects a presence of a signal short between the first pad and the second pad; and receiving information corresponding to the signal short.
A method for testing an integrated circuit (IC), the IC having a first pad configured as a signal interface for components external to the IC, the first pad having a first receiver configured to receive an input signal from a component external to the IC, said method comprising:
An integrated circuit (IC) comprising:
An integrated circuit (IC) comprising:
A system for testing an integrated circuit, said system comprising:
Dependencies are inferred from the claim text.