A semiconducting thin film structure comprising a pattern of semiconducting material on a substrate, said semiconducting material comprising a sintered mixture of passivated semiconductor nanoparticles in a hydrogenated, at least partially amorphous Group IVA element, said Group IVA element comprising at least one of silicon and germanium, said semiconducting material having improved conductivity, density, adhesion and/or carrier mobility relative to an otherwise identical structure made by an identical process, but without either the passivated semiconductor nanoparticles or the hydrogenated, at least partially amorphous Group IVA element.