Methods and systems for testing materials
OwnerGlen Hilderbrand, John D' Angelo +3inventors
InventorsGlen Hilderbrand, John D' Angelo, Timothy Decker, Russell Baucke, John Nelson
Life of this patent
Estimating the term…
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OwnerGlen Hilderbrand, John D' Angelo +3inventors
InventorsGlen Hilderbrand, John D' Angelo, Timothy Decker, Russell Baucke, John Nelson
Estimating the term…
Methods and systems for evaluating a material sample is provided. The system includes a material sample holder including a first flange having an aperture therethrough, a second flange having an aperture therethrough, the first and second flanges configured to frictionally hold a material sample sandwiched therebetween, a waveguide coupled to a first end of each of the first flange and the second flange, each waveguide configured to direct electromagnetic waves through respective apertures, a waveguide adapter communicatively coupled to a second end of each waveguide, and a control unit electrically coupled to the wave source, the control unit configured to control the waveguide adapter to transmit and receive electromagnetic wave signals.
A testing system for evaluating a material sample, said testing system comprising:
A material sample holder for testing an electromagnetic energy absorbent material, said material sample holder comprising:
A method of evaluating a material sample, said method comprising:
Dependencies are inferred from the claim text.