Back to results
US 2006/0142963 A1Published application
Lock-out device and semiconductor integrated circuit device including the same
AssigneeSamsung Electronics Co., Ltd.
InventorPan-Suk Kwak
Life of this patent
Estimating the term…
Abstract
A lock-out device is provided that determines whether to lock out a chip or not according to the result of operation voltage drop detected at a plurality of positions in a semiconductor integrated circuit device. As a result, unnecessary lock-out operations can be prevented and a program operation or an erase operation in a semiconductor memory device can be executed stably.
Claims12
A lock-out device, comprising:
- a plurality of lock-out circuits that generate lock-out signals according to levels of operation voltages detected at a plurality of positions in an integrated circuit device;
- and
- a lock-out controller that determines whether to lock out the integrated circuit device or not by combining the plurality of generated lock-out signals.
A semiconductor integrated circuit device, comprising:
- a semiconductor memory that executes a program operation, an erase operation and a read operation by producing operation voltage internally according to a voltage applied from an external circuit;
- and
- a lock-out device that terminates an operation of the semiconductor memory according to the voltage level detected at a plurality of positions in the semiconductor memory.
Dependencies are inferred from the claim text.