Pin electronics with high voltage functionality
AssigneeTeradyne, Inc.
InventorsErnest Walker, Ronald Sartschev
Life of this patent
Estimating the term…
Abstract
In one aspect, the invention is an integrated circuit (IC) for use in testing a device. The IC includes a pin electronics (PE) driver having an output and a pin. The IC also includes a buffer connected to the output of the PE driver and the pin. The first voltage measured at the pin is greater than a second voltage measured at the output. The IC may include a first amplifier having an input connected to a voltage source. The IC may also include a second amplifier having an input connected to the output of the PE driver.
Claims18
An integrated circuit (IC) for use in testing a device, comprising:
- a pin electronics (PE) driver having an output;
- a pin;
- and
- a buffer connected to the output of the PE driver and the pin;
- wherein a first voltage measured at the pin is greater than a second voltage measured at the output;
- wherein the buffer comprises a first amplifier having an input connected to a voltage source and a second amplifier having an input connected to the output of the PE driver;
- and
- wherein the buffer comprises a switching mechanism configured to establish, in a first mode, a first electrical connection between the first amplifier and the pin, and, in a second mode, to establish a second electrical connection between the second amplifier and the pin.
(canceled)
(canceled)
(canceled)
Automatic test equipment (ATE) for use with a device under test, the ATE comprising:
- an integrated circuit (IC) comprising:
- a pin electronics (PE) driver having an output having a second voltage;
- a high voltage pin having a first voltage that is greater than the second voltage;
- and
- a buffer connected to the output of the PE driver and to the high voltage pin, wherein the buffer comprises:
- a first amplifier having an input connected to the output of the PE driver;
- a second amplifier having an input connected to a termination voltage;
- and
- a switching mechanism configured to establish, in a first mode, a first electrical connection between the first amplifier and the high voltage pin, and, in a second mode, to establish a second electrical connection between the second amplifier and the high voltage pin.
(canceled)
A method of testing a device, comprising:
- connecting an output of a pin electronics (PE) driver to a buffer, wherein the buffer comprises:
- a first amplifier having a Rain of about one, the first amplifier including an input connected to an output of the PE driver;
- and
- a second amplifier having a gain greater than one, the second amplifier including an input connected to a voltage source;
- connecting the buffer to a pin;
- receiving a signal indicating a first mode or a second mode;
- in the first mode, establishing a first electrical connection between the first amplifier and the pin;
- and
- in the second mode, establishing a second electrical connection between the second amplifier and the pin;
- and
- providing a first voltage at the pin greater than a second voltage at the output of the PE driver.
(canceled)
Dependencies are inferred from the claim text.