Method and apparatus for storage device read phase auto-calibration
AssigneeRealtek Semiconductor Corp.
InventorsYi-Shu Chang, Seng-Huang Tang
Life of this patent
Estimating the term…
Abstract
The present invention provides a method and apparatus for performing read phase auto-calibration of a storage device. The method includes writing the data with at least one predetermined pattern into the storage device, reading the data according to a read phase of a plurality of read phases, comparing the predetermined pattern with the data, and selecting a read phase from the plurality of read phases according to the comparing result.
Claims15
A method for performing read phase auto-calibration of a storage device, the method comprising:
- writing data with at least one predetermined pattern into the storage device;
- reading the data stored in the storage device by using at least one read phase of a plurality of read phases;
- comparing the read data with the predetermined pattern;
- and
- selecting a read phase from the plurality of read phases according to the comparing result.
A circuit for performing read phase auto-calibration of a storage device, the circuit comprising:
- a control unit coupled to the storage device for determining a read phase among a plurality of read phases and outputting a multiplexing signal according to the determined read phase;
- a delay chain for generating a plurality of delay signals;
- and
- a multiplexer coupled to the control unit and the delay chain for selecting a delay signal among the delay signals according to the multiplexing signal.
Dependencies are inferred from the claim text.