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US 2006/0077391 A1Published application
Measuring method and system
AssigneeFuji Photo Film Co., Ltd.
InventorToshihito Kimura
Life of this patent
Estimating the term…
Abstract
A measuring signal in the detecting area is calibrated on the basis of a measuring signal in the reference area by the reference method. The rate of change with time of the difference between the measuring signal and an estimated result of the measurement (ORU constant) is calculated in the period where it is expected that the signal shows a fixed value and the components which change at a rate of change calculated for the entire period of the measuring period with the instance when a buffer containing thereon an analyte is supplied taken as a reference are taken as the drift components and correction to remove the drift components from the measuring signal is carried out.
Claims8
A measuring method in a measuring method which makes measurement with a measuring system comprising a measuring unit having a dielectric block, a film layer formed on one face of the dielectric block and a sample holding mechanism for holding a sample in contact with the film layer with the film layer having a detecting area where a ligand is fixed to the surface thereof and a reference area where no ligand is fixed to the surface thereof,
- a light source emitting a light beam,
- an incident optical system which causes the light beam to impinge upon a first interface of the dielectric block and a detecting area of the film layer and a second interface of the dielectric block and a reference area of the film layer at various angles of incidence so that total internal reflection conditions are satisfied at the first and second interfaces,
- a photodetector means which detects the intensities of the light beams reflected in total internal reflection at the first and second interfaces independently from each other and
- a measuring means which measures information on refractive indexes of objects to be measured in contact with the pair of areas of the film layer on the basis of the result of detection of the photodetector means,
- which method comprises the steps of
- carrying out the measurement for a predetermined period in each of the detecting area and the reference area,
- calibrating the result of measurement in the detecting area on the basis of the result of measurement in the reference area, and
- by removing correcting result of the measurement in the detecting area after the calibration drift components extracted from the result of measurement in the detecting area after the calibration by a predetermined method.
5 more elements
A measuring method in a measuring method which makes measurement with a measuring system comprising
- a measuring unit having a dielectric block, a film layer formed on one face of the dielectric block and a sample holding mechanism for holding a sample in contact with the film layer with the film layer having a detecting area where a ligand is fixed to the surface thereof and a reference area where no ligand is fixed to the surface thereof,
- a light source emitting a light beam,
- an incident optical system which causes the light beam to impinge upon a first interface of the dielectric block and a detecting area of the film layer and a second interface of the dielectric block and a reference area of the film layer at various angles of incidence so that total internal reflection conditions are satisfied at the first and second interfaces,
- a photodetector means which detects the intensities of the light beams reflected in total internal reflection at the first and second interfaces independently from each other and
- a measuring means which measures information on refractive indexes of objects to be measured in contact with the pair of areas of the film layer on the basis of the result of detection of the photodetector means,
- which method comprises the steps of
- carrying out the measurement for a predetermined period in each of the detecting area and the reference area,
- correcting the result of measurement in the detecting area by removing from the result of measurement in the detecting area drift components extracted from the result of measurement in the detecting area by a predetermined method,
- correcting the result of measurement in the reference area by removing from the result of measurement in the reference area drift components extracted from the result of measurement in the reference area by a predetermined method, and
- calibrating the result of measurement in the detecting area after the correction on the basis of the result of measurement in the reference area after the correction.
7 more elements
A measuring system in a measuring system comprising
- a measuring unit having a dielectric block, a film layer formed on one face of the dielectric block and a sample holding mechanism for holding a sample in contact with the film layer with the film layer having a detecting area where a ligand is fixed to the surface thereof and a reference area where no ligand is fixed to the surface thereof,
- a light source emitting a light beam, an incident optical system which causes the light beam to impinge upon a first interface of the dielectric block and a detecting area of the film layer and a second interface of the dielectric block and a reference area of the film layer at various angles of incidence so that total internal reflection conditions are satisfied at the first and second interfaces,
- a photodetector means which detects the intensities of the light beams reflected in total internal reflection at the first and second interfaces independently from each other and
- a measuring means which measures information on refractive indexes of objects to be measured in contact with the pair of areas of the film layer on the basis of the result of detection of the photodetector means,
- wherein the improvement comprises
- a calibrating means which calibrates the result of measurement in the detecting area carried out for a predetermined period on the basis of the result of measurement in the reference area carried out for the predetermined period, and
- a correcting means which removes from the result of measurement in the detecting area after the calibration drift components extracted from the result of measurement in the detecting area after the calibration by a predetermined method.
4 more elements
A measuring system in a measuring system comprising
- a measuring unit having a dielectric block, a film layer formed on one face of the dielectric block and a sample holding mechanism for holding a sample in contact with the film layer with the film layer having a detecting area where a ligand is fixed to the surface thereof and a reference area where no ligand is fixed to the surface thereof,
- a light source emitting a light beam,
- an incident optical system which causes the light beam to impinge upon a first interface of the dielectric block and a detecting area of the film layer and a second interface of the dielectric block and a reference area of the film layer at various angles of incidence so that total internal reflection conditions are satisfied at the first and second interfaces,
- a photodetector means which detects the intensities of the light beams reflected in total internal reflection at the first and second interfaces independently from each other and
- a measuring means which measures information on refractive indexes of objects to be measured in contact with the pair of areas of the film layer on the basis of the result of detection of the photodetector means,
- wherein the improvement comprises
- a correcting means which corrects the result of measurement in the detecting area to remove from the result of measurement in the detecting area drift components extracted from the result of measurement in the detecting area carried out for a predetermined period by a predetermined method and corrects the result of measurement in the reference area to remove from the result of measurement in the reference area drift components extracted from the result of measurement in the reference area carried out for the predetermined period by a predetermined method, and
- a calibrating means which calibrates the result of measurement in the detecting area corrected by the correcting means on the basis of the result of measurement in the reference area corrected by the correcting means.
5 more elements
Dependencies are inferred from the claim text.