Capacitive sensor measurement method for discrete time sampled system for in-circuit test
AssigneeAgilent Technologies, Inc.
InventorsCurtis Tesdahl, Ronald Peiffer
Life of this patent
Estimating the term…
Loading patent…
AssigneeAgilent Technologies, Inc.
InventorsCurtis Tesdahl, Ronald Peiffer
Estimating the term…
Disclosed is a novel method and apparatus for acquiring multiple capacitively sensed measurements from a circuit under test. Multiple digital sources are respectively connected to stimulate multiple respective first ends of multiple respective nets of interest. Respective second ends of the multiple respective nets of interest are capacitively sensed. The respective capacitively coupled signals are digitally sampled and shift correlated with respective expected digital signatures. If a high level of correlation is found for a given net, the net is electrically intact; otherwise, the net is characterized by either an open or some other fault that prevents it from meeting specification.
A method for testing electrical integrity of nets on an electronic device, said method comprising the steps of:
Dependencies are inferred from the claim text.