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AssigneeHitachi, Ltd.
InventorsKoji Matsuda, Kazuo Hiramoto, Kunio Moriyama
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To ensure irradiation accuracy and safety, even when an irradiation device employing a different irradiation method is used, disclosed is herein a charged particle beam irradiation apparatus that irradiates an irradiation target with charged particle beams includes: a charged particle beam generator for generating the charged particle beams; a passive scattering irradiation device and a scanning irradiation device, both for irradiating the irradiation target with the charged particle beams; a beam transport system for transporting the charged particles beam extracted from the charged particle beam generator, to selected one of the two irradiation devices; and a central controller that modifies operating parameters on the charged particle beam generator, according to the irradiation method adopted for the selected irradiation device.
A charged particle beam irradiation apparatus that irradiates an irradiation target with a charged particle beam, said apparatus comprising:
A charged particle beam irradiation apparatus that irradiates an irradiation target with a charged particle beam, said apparatus comprising:
A method of charged particle beam irradiation in which the charged particle beam generated by a charged particle beam generator is emitted in transported form to selected one of plural irradiation devices whose irradiation methods include a different irradiation method;
A method of charged particle beam irradiation in which the charged particle beam generated by a charged particle beam generator which includes a cyclotron is emitted in transported form to selected one of plural irradiation devices whose irradiation methods include a different irradiation method;
Dependencies are inferred from the claim text.