Method and apparatus for forming silicon nitride film
AssigneeTokyo Electron Limited
InventorsKazuhide Hasebe, Mitsuhiro Okada
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AssigneeTokyo Electron Limited
InventorsKazuhide Hasebe, Mitsuhiro Okada
Estimating the term…
A method for forming a silicon nitride film first deposits a silicon nitride film on a target substrate by CVD in a process field within a reaction container. This step is arranged to supply a first process gas containing a silane family gas and a second process gas containing a nitriding gas to the process field, and set the process field at a first temperature and a first pressure, for a first time period. The method then nitrides a surface of the silicon nitride film in the process field. This step is arranged to supply a surface-treatment gas containing a nitriding gas to the process field without supplying the first process gas, and set the process field at a second temperature and a second pressure, for a second time period shorter than the first time period.
A method for forming a silicon nitride film, comprising:
An apparatus for forming a silicon nitride film, comprising:
A computer readable medium containing program instructions for execution on a processor, which, when executed by the processor, cause an apparatus for forming a silicon nitride film to execute p1 depositing a silicon nitride film on a target substrate by CVD in a process field within a reaction container, while supplying a first process gas containing a silane family gas and a second process gas containing a nitriding gas to the process field, and setting the process field at a first temperature and a first pressure, for a first time period;
Dependencies are inferred from the claim text.