System and method for applying within-die adaptive body bias

A biasing method, comprising:

• generating different first and second body bias signals;
• and
• controlling one or more first-type transistors in a first section of an IC die based on the first body bias signal, and controlling one or more first-type transistors in a second section of the die based on the second body bias signal, wherein the first-type transistors are the only transistor types controlled by the first and second body bias signals in the first and second sections.

A method for testing an IC die, comprising:

• applying a series of bias voltages to each of a plurality of sections of an IC die;
• and
• determining different ones of said voltages for body biasing first-type transistors in said sections based on results of the applied voltages, wherein the first-type transistors are the only transistor types to be biased by the different identified voltages.