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US 2006/0066326 A1Published application
Non-contact tester for electronic circuits
AssigneeScanimetrics Inc.
InventorSteven Harold Slupsky
Life of this patent
Estimating the term…
Abstract
A non-contact tester for electronic circuits consists of an electronic circuit and independent scanning head, in combination. The electronic circuit includes a micro-fabricated wireless i/o cell and means for sending and receiving signals via the wireless i/o cell. The independent scanning head has a wireless i/o cell that is compatible with the wireless i/o cell on the electronic circuit. This enables data to be exchanged with the electronic circuit to confirm proper functioning of the electronic circuit.
Claims6
A tester for electronic circuits, comprising in combination:
- an electronic circuit which includes a plurality of wireless i/o cells and means for sending and receiving signals via each of the wireless i/o cells, a wireless i/o cell being provided for each contact point on the electronic circuit to be tested;
- an independent scanning head having a plurality of wireless i/o cells compatible with the [at least one] wireless i/o cells on the electronic circuit, such that data may be exchanged with the electronic circuit to confirm proper functioning of the electronic circuit, the number of wireless i/o cells on the independent scanning head corresponding in a one to one relationship with the number of wireless i/o cells on the electronic circuit being tested;
- the scanning head having a contact probe for power input to energize the electronic circuit.
Dependencies are inferred from the claim text.