Device and method for the quantified evaluation of surface characteristics
AssigneeBYK Gardner GmbH
InventorKonrad Lex
Life of this patent
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Abstract
A device for the quantified evaluation of surface characteristics including a first radiation structure which is arranged in a first predetermined angle with respect to a surface to be analyzed and which directs radiation onto the surface to be analyzed, wherein the radiation directed onto the surface has at least one component with wavelengths in the infrared area, a detection apparatus arranged in a second predetermined angle with respect to the surface to be analyzed detecting the radiation radiated onto the surface and being thrown back from it.
Claims22
A device for the quantified evaluation of surface qualities comprising:
- a first radiation means which is arranged in a first predetermined angle with respect to the surface to be analyzed and directing radiation onto the surface to be analyzed, wherein the radiation directed onto the surface has at least one component with wavelengths in the infrared area, and
- a detection means arranged in a second predetermined angle with respect to the surface to be analyzed detecting the radiation irradiated onto the surface and thrown back from it.
A method for the quantified evaluation of surface characteristics with the steps:
- irradiation of radiation onto a surface to be analyzed wherein this radiation has at least one component in the infrared wavelength area;
- detection of the light irradiated onto the surface and thrown back from it and generation of a signal characteristic for this light;
- and
- evaluation of the characteristic signal.
Dependencies are inferred from the claim text.