Test apparatus and testing method

A testing method testing a device under test by means of a test apparatus,

• the test apparatus comprising a main memory that has an expectation pattern storing region storing an expectation pattern sequence to be sequentially compared with a plurality of output patterns sequentially output from a terminal of the device under test, and
• the testing method comprising:
• a test pattern outputting step of sequentially inputting a plurality of test patterns into the device under test and sequentially outputting the output patterns from the device under test;
• a capture step of sequentially acquiring the output patterns into an output pattern storing region on said main memory;
• a memory reading step of reading an output pattern sequence consisting of the plurality of acquired output patterns and the expectation pattern sequence from said main memory when the acquisition process acquiring the output patterns into the output pattern storing region has been terminated;
• and
• an expectation comparing step of comparing the read expectation pattern sequence and the output pattern sequence.