Method for testing an electric circuit

A method for testing an electric circuit, comprising:

• a) applying a first data signal to a first electric circuit, the first electric circuit produced by a first process sequence;
• b) generating a signal indicative if said first electric circuit is defective by comparing a second data signal with a data signal generated by said first electric circuit in response to said first data signal;
• c) producing a second electric circuit by a predetermined second process sequence which includes incorporating intentionally at least one predetermined defect structure into said second electric circuit;
• d) applying the first data signal to said second electric circuit and comparing the second data stream with a data signal generated by said second electric circuit in response to said first data signal;
• e) repeatedly modifying the first data signal and applying said modified first data signal to said second electric circuit until said comparison indicates a defect of said second electric circuit;
• and
• f) storing information about the modified first data signal which results in said indication about the defect of said second electric circuit.

A method for testing an electric circuit, comprising:

• a) applying a first data signal to a first electric circuit, the first electric circuit produced by a first process sequence;
• b) generating a signal indicative if said first electric circuit is defective by comparing a second data signal with a data signal generated by said first electric circuit in response to said first data signal;
• c) providing a second electric circuit generated by a predetermined second process sequence which includes incorporating intentionally at least one predetermined defect structure into said second electric circuit;
• d) determining a third data signal, the third data signal configured such that when applied to said second electric circuit, a comparison of the second data stream with a data signal generated by said second electric circuit in response to said third data signal indicates a defect of said second electric circuit;
• and
• e) storing information about the third data signal which results in said indication about the defect of said second electric circuit.