Method and apparatus for remotely buffering test channels
AssigneeFormFactor, Inc.
InventorCharles Miller
Life of this patent
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AssigneeFormFactor, Inc.
InventorCharles Miller
Estimating the term…
A system is provided to enable leakage current measurement or parametric tests to be performed with an isolation buffer provided in a channel line. Multiple such isolation buffers are used to connect a single signal channel to multiple lines. Leakage current measurement is provided by providing a buffer bypass element, such as a resistor or transmission gate, between the input and output of each buffer. The buffer bypass element can be used to calibrate buffer delay out of the test system by using TDR measurements to determine the buffer delay based on reflected pulses through the buffer bypass element. Buffer delay can likewise be calibrated out by comparing measurements of a buffered and non-buffered channel line, or by measuring a device having a known delay.
An apparatus comprising:
A probe card comprising:
An apparatus comprising:
A method of measuring the delay of a buffer in a test circuit, the method comprising:
A method of measuring the delay of a buffer in a test circuit, wherein the buffer is provided in a first transmission line, the method comprising:
A method of calibrating out a delay of a buffer in a test circuit, the method comprising:
Dependencies are inferred from the claim text.