Test method for unit re-modification
AssigneeVIA Technologies, Inc.
InventorsDyson Chang, Daniel Kao
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AssigneeVIA Technologies, Inc.
InventorsDyson Chang, Daniel Kao
Estimating the term…
The present invention described a test method for unit re-modification, in which there is a test end and a host end. The method generated a sample pattern at a test end, generates a control pattern and modifies a re-modification unit. Otherwise, an experimental pattern is generated and then whether or not the original function is retained after modifying the re-modification unit is determined according to the result of comparison of the control pattern and experimental pattern thereon. The present invention is used to test the internal function module of specific software or hardware, and ensure that the proper function is retained after re-modification.
A test method for unit re-modification, the test method being used to optimize a re-modification unit, wherein the test method comprises:
A test method for unit re-modification, the test method being is used to optimize a re-modification unit, wherein the method comprises:
Dependencies are inferred from the claim text.