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AssigneeHon Hai Precision Industry Co., Ltd.
InventorMing-Chih Hsieh
Estimating the term…
A circuit for testing a power down reset function of an electronic device includes a reference power source (Vref), a first variable resistor (R1) with one end connected to the reference power source, a second variable resistor (R2), and a jumper (10). One end of the second variable resistor is connected to the other end of the first variable resistor, and the other end of the second variable resistor is grounded. The jumper includes four pins, with a first pin (101) connected to a node (B) between the first variable resistor and the second variable resistor, a third pin (103) grounded, and a second pin (102) and a fourth pin (104) commonly connected to a voltage testing pin (20) of an electronic device (2). The circuit is simple, is conveniently operated, and saves costs.
A circuit for testing a power down reset function of an electronic device, the circuit comprising:
A circuit for testing a power down reset circuit of an electronic device, comprising:
A method for testing a power down reset function of an electronic device, comprising the steps of:
Dependencies are inferred from the claim text.