Device for a goniometric examination of the optical properties of surfaces

A device for examining the optical properties of surfaces comprising

• at least one first radiation means emitting radiation at least at a first predetermined spatial angle to a surface to be examined;
• at least one first detector means for capturing the radiation emitted to and reflected back from the surface wherein said first detector means, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to said surface;
• and
• at least one further radiation means or detector means which emits radiation to the surface to be examined or detects radiation emitted to and reflected back from the surface.

A method for examining the properties of optical surfaces including the steps:

• directing a first radiation at a surface at least at one first predetermined spatial angle (α1;
• β1);
• detecting the radiation reflected back from the surface to be examined, by means of a first detector means at least at one second predetermined spatial angle (α2;
• β2), wherein said detector means allows a local resolution of detected radiation;
• changing at least one spatial angle (α2;
• β2) to a spatial angle (α2′;
• β2′);
• and
• detecting the radiation reflected back from the surface to be examined by means of said first detector means at the changed second spatial angles (α2′;
• β2′).

A method for examining the properties of optical surfaces including the steps:

• directing a first radiation at a surface to be examined at least at one first predetermined spatial angle (α1′;
• β1′);
• detecting the radiation reflected back from the surface to be examined, by means of a first detector means at least at one second predetermined spatial angle (α2;
• β2), wherein said detector means allows a local resolution of detected radiation;
• changing at least one spatial angle (α1;
• β1) to a spatial angle (α1′;
• β1′);
• directing the first radiation at a surface to be examined at the changed spatial angle (α1′;
• β1′);
• and
• detecting the radiation reflected back from the surface to be examined by means of a first detector means at the changed second spatial angle (α2, β2).

A method for examining the properties of optical surfaces including the steps:

• directing a first radiation at a surface to be examined at a first predetermined spatial subangle;
• detecting the radiation reflected back from the surface to be examined, by means of a first detector means at a second predetermined spatial angle, wherein said detector means allows a local resolution of detected radiation;
• and
• detecting the radiation reflected back from the surface to be examined by means of a second detector means at a third predetermined spatial angle.

A method for examining the properties of optical surfaces including the steps:

• directing a first radiation at a surface to be examined at a first predetermined spatial subangle;
• directing a second radiation at a surface to be examined at a third predetermined spatial angle;
• and
• detecting the radiation reflected back from the surface to be examined, by means of a first detector means at a second predetermined spatial angle, wherein said detector means allows a local resolution of detected radiation.