Circuit and method for detecting skew of transistor in semiconductor device
AssigneeHynix Semiconductor Inc.
InventorsHwang Hur, Jun-Gi Choi
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Abstract
A circuit and method for easily detecting skew of a transistor within a semiconductor device are provided. The circuit for detecting the skew of the transistor includes a linear voltage generating unit for outputting a linear voltage by using a first supply voltage, a first attenuation unit for reducing variation width of the linear voltage according to the performance of the transistor, a saturation voltage generating unit for outputting a saturation voltage by using a second supply voltage, and a comparison unit for comparing an output of the first attenuation unit and the saturation voltage.
Claims18
A circuit for detecting skew of a transistor comprising:
- a linear voltage generating unit for outputting a linear voltage by using a first supply voltage;
- a first attenuation unit for reducing variation width of the linear voltage according to the performance of the transistor;
- a saturation voltage generating unit for outputting a saturation voltage by using a second supply voltage;
- and
- a comparison unit for comparing an output of the first attenuation unit and the saturation voltage.
A circuit for detecting skew of a transistor comprising:
- a linear voltage generating unit for outputting a linear voltage by using a first supply voltage;
- a first attenuation unit for reducing variation width of the linear voltage according to the performance of the transistor;
- a saturation voltage generating unit for outputting a saturation voltage by using a second supply voltage whose level is higher than that of the first supply voltage;
- a voltage adjusting unit for adjusting an output of the first attenuation unit to a certain voltage level so as to easily compare said output with the saturation voltage;
- and
- a comparison unit for comparing an output of the voltage adjusting unit and the saturation voltage.
A method for detecting skew of transistor, which comprises of the steps of:
- generating a linear voltage by using a first supply voltage;
- reducing variation width of the linear voltage according to the performance of the transistor, thereby outputting an attenuated linear voltage;
- producing a saturation voltage by using a second supply voltage;
- and
- comparing the attenuated linear voltage and the saturation voltage.
Dependencies are inferred from the claim text.