Temperature-programmed desorbed gas analyzing apparatus
AssigneeRigaku Corporation
InventorsTadashi Arii, Yoshihiro Takata, Shuichi Matsuo
Life of this patent
Estimating the term…
Loading patent…
AssigneeRigaku Corporation
InventorsTadashi Arii, Yoshihiro Takata, Shuichi Matsuo
Estimating the term…
A temperature-programmed desorbed gas analyzing apparatus including a sample chamber 1 in which a sample S is disposed, an infrared heating furnace 2 for heating the sample S disposed in the sample chamber 1, a measuring chamber 3 in which gas desorbed from the sample S by heating is introduced, a turbo molecular pump 4 for reducing the pressure in the measuring chamber 3, a mass spectrometer 5 having a gas detection portion 5a disposed in the measuring chamber 3, an intermediate pressure-reduced chamber 6 provided between the sample chamber 1 and the measuring chamber 3, a first orifice 7 which the intermediate pressure-reduced chamber 6 and the sample chamber 1 intercommunicate with each other, and a second orifice 8 through which the intermediate pressure-reduced chamber 6 and the measuring chamber 3 intercommunicate with each other, and the desorbed gas occurring in the sample chamber 1 is introduced through the first orifice 7, the intermediate pressure-reduced chamber 6 and the second orifice 8 into the measuring chamber 3. The pressure in the intermediate pressure-reduced chamber 6 or the measuring chamber 3 is controlled by pressure adjusting unit so as to be fixed.
A temperature-programmed desorbed gas analyzing apparatus comprising:
A temperature-programmed desorbed gas analyzing apparatus comprising:
Dependencies are inferred from the claim text.