Heterojunction bipolar transistor
AssigneeSTMicroelectronics S.r.l.
InventorsBertrand Martinet, Michel Marty, Pascal Chevalier, Alain Chantre
Life of this patent
Estimating the term…
Loading patent…
AssigneeSTMicroelectronics S.r.l.
InventorsBertrand Martinet, Michel Marty, Pascal Chevalier, Alain Chantre
Estimating the term…
A method for forming a heterojunction bipolar transistor including the steps of: forming in a semiconductor substrate a collector area of a first doping type; growing by epitaxy above a portion of the collector area a silicon/germanium layer of a second doping type forming a base area; forming above the silicon/germanium layer a sacrificial emitter formed of a material selectively etchable with respect to the silicon/germanium layer and with respect to the layers and consecutively-formed insulating spacers; forming first insulating spacers on the sides of the sacrificial emitter; growing by epitaxy a silicon layer above the exposed portions of the silicon/germanium layer; forming second insulating spacers adjacent to the first spacers and laid on the silicon layer; covering the entire structure with an insulating layer; partially removing the insulating layer above the sacrificial emitter and removing the sacrificial emitter; filling the space previously taken up by the sacrificial emitter with a semiconductor material of the first doping type.
A method for forming a bipolar transistor with a heterojunction comprising:
A heterojunction bipolar transistor comprising a collector of a first doping type formed in a silicon substrate, a base formed of a silicon/germanium layer of a second doping type covering the collector, and an emitter comprising a central silicon portion of the first doping type laid on a portion of the base, first insulating spacers being adjacent to the sides of the central portion of the emitter and laid on the silicon/germanium layer, portions of the base covered neither by the central portion of the emitter nor by the spacers being covered with a silicon layer of the second doping type, second insulating spacers being adjacent to the first spacers and laid on the silicon layer, the second spacers and the silicon layer being covered at least partially with an insulating layer, the portions in contact of the insulating layer and of the second spacers being formed of different insulators, the emitter prolonging in lateral extensions, above the first and second spacers and the insulating layer.
Dependencies are inferred from the claim text.