Method for manufacturing semiconductor device
AssigneeSemiconductor Energy Laboratory Co., Ltd., a Japan corporation
InventorsHisashi Ohtani, Akiharu Miyanaga, Satoshi Teramoto, Shunpei Yamazaki
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AssigneeSemiconductor Energy Laboratory Co., Ltd., a Japan corporation
InventorsHisashi Ohtani, Akiharu Miyanaga, Satoshi Teramoto, Shunpei Yamazaki
Estimating the term…
In a method for manufacturing a crystalline silicon film by utilizing a metal element that accelerates the crystallization of silicon, an adverse influence of this metal element can be suppressed. A semiconductor device manufacturing method is comprised of the steps of: forming an amorphous silicon film on a substrate having an insulating surface; patterning the amorphous silicon film to form a predetermined pattern; holding a metal element that accelerates the crystallization of silicon in such a manner that the metal element is brought into contact with the amorphous silicon film; performing a heating process to crystalize the amorphous silicon film, thereby being converted into a crystalline silicon film; and etching a peripheral portion of the pattern of the crystalline silicon film.
A method for manufacturing a semiconductor device comprising:
A method for manufacturing a semiconductor device comprising:
A method for manufacturing a semiconductor device comprising:
A method of manufacturing a semiconductor device comprising:
Dependencies are inferred from the claim text.