System and method for detecting defects in a thin-film-transistor array
AssigneeYieldBoost Tech, Inc.
InventorKyo Young Chung
Life of this patent
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Abstract
A system and method for detecting a defect in a transistor array includes applying a test signal to the array, monitoring pixel voltages along a gate line of the array, and detecting a defect associated with the gate line based on a variation in the pixel voltages along the gate line during the monitoring step. The system and method can also detect a precise location of the defect based on a rate of change in the variation of the pixel voltages along the gate line.
Claims28
A method for detecting a defect in a transistor array, comprising:
- applying a test signal to the array;
- monitoring pixel voltages at different monitoring points along a gate line of the array;
- and
- detecting a defect associated with the gate line based on how the pixel voltages vary from one monitoring point to another monitoring point during said monitoring step.
A system for detecting a defect in a transistor array, comprising:
- a signal generator which applies a test signal pattern to the array;
- and
- a detector which detects a defect in the array based on how pixel voltages vary between monitoring points along an array gate line.
A signal analyzer for testing a TFT array, comprising:
- at least one electrode for inputting a test signal into the TFT array;
- and
- a processor which monitors how pixel voltages vary between monitoring points along a gate line of the array, and detects a defect associated with the gate line based on the variation.
Dependencies are inferred from the claim text.