Method and apparatus for interconnect built-in self test based system management performance tuning
AssigneeIntel Corporation
InventorsThomas M. Slaight, Jay J. Nejedio, Russell L. Carr
Life of this patent
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AssigneeIntel Corporation
InventorsThomas M. Slaight, Jay J. Nejedio, Russell L. Carr
Estimating the term…
A method and apparatus for Interconnect Built-In Self-Test (IBIST) Based System Management Performance Tuning provides for measuring operating conditions of an interconnect, which is between a first device and a second device in a post-production system, at operating speed with a set of one or more test data and a first set of one or more operating parameters. Results of the measuring are stored and operating conditions of the interconnect with the set of test data and a second set of operating parameters are measured. The method and apparatus further provides for selecting either the first or second set of operating parameters based on the measuring of operating conditions to optimize operation of the post-production system.
A method comprising:
A method comprising:
An apparatus comprising:
A post-production system comprising:
A machine-readable medium that provides instructions, which when executed by a set of one or more processors, cause said set of processors to perform operations comprising:
Dependencies are inferred from the claim text.