Measurement of local oscillation leakage in a radio frequency integrated circuit
AssigneeBroadcom Corporation
InventorHea Joung Kim
Life of this patent
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AssigneeBroadcom Corporation
InventorHea Joung Kim
Estimating the term…
The measuring of local oscillation leakage in radio frequency integrated circuits (RFICs) begins by concurrently enabling a transmitter portion and a receiver portion of a radio frequency integrated circuit. The processing then continues by providing a zero input to the transmitter portion such that information contained in the RF signals corresponds to local oscillation leakage produced by the transmitter portion. The processing continues by detecting the concurrent enablement of the transmitter and receiver portions. The processing continues by measuring, via the receiver portion, the received signal strength of the RF signals. The processing continues by processing the received signal strength over a predetermined period of time commencing upon the detection of the concurrent enablement to obtain a measure of the local oscillation leakage.
A method for measuring local oscillation leakage in a radio frequency integrated circuit (RFIC), the method comprises:
An apparatus for measuring local oscillation leakage in a radio frequency integrated circuit (RFIC), the apparatus comprises:
A radio frequency integrated circuit (RFIC) comprises:
Dependencies are inferred from the claim text.