Current probe
AssigneeTektronix, Inc.
InventorKatsuhisa Kato
Life of this patent
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AssigneeTektronix, Inc.
InventorKatsuhisa Kato
Estimating the term…
A current probe suitable for detecting a large current from DC to high frequency has first and second current detecting means. The first current detecting means detects a current under test from DC to a predetermined intermediate frequency band. It has an orthogonal flux gate element, an induced voltage detecting circuit 46 for detecting an induced voltage of the orthogonal fluxgate element, and a feedback coil 50 receiving the output voltage of the induced voltage detecting circuit 46 for generating magnetic flux to cancel the magnetic flux generated by the current under test. The second current detecting means has a Rogowski coil 12 and an integration circuit and detects said current under test higher than the predetermined intermediate frequency band.
A current probe for detecting a value of a current flowing in a signal line under test, comprising:
Dependencies are inferred from the claim text.