Apparatus and method for detecting alpha-ray

An α-ray measuring apparatus comprising:

• an α-ray detector including a plurality of semiconductor detectors arranged on a plane surface;
• an adder for adding output signals from said respective semiconductor detectors to generate an addition output signal;
• an anticoincidence counter for anticoincidently counting the output signals from said respective semiconductor detectors;
• and
• a peak analyzer for analyzing an energy distribution of α-rays based on an addition of the output signals of semiconductor detectors which are not anticoincidently counted.

An α-ray measuring apparatus comprising:

• an α-ray detector including a plurality of semiconductor detectors arranged one above another;
• an adder for adding output signals from said respective semiconductor detectors to generate an addition output signal;
• an anticoincidence counter for anticoincidently counting the output signals of said respective semiconductor detectors;
• and
• a peak analyzer for analyzing an energy distribution of α-rays based on an addition of the output signals of said respective semiconductor detectors which are not anticoincidently counted.

An α-ray measuring apparatus comprising:

• an α-ray detector including a plurality of semiconductor detectors arranged on plane surfaces placed one above another;
• an adder associated with each plane surface for adding output signals from said respective semiconductor detectors on said associated plane surface to generate an addition output signal;
• an anticoincidence counter for anticoincidently counting the addition output signals of said respective sensors on said respective plane surfaces;
• and
• a peak analyzer for analyzing an energy distribution of α-rays based on the addition output signals from said respective semiconductor detectors on said respective plane surfaces which are not anticoincidently counted.

An α-ray measuring method comprising the steps of:

• detecting α-rays using a plurality of semiconductor detectors;
• adding output signals from said respective semiconductor detectors;
• and
• analyzing an energy distribution of the α-rays based on an addition of the output signals from said semiconductor detectors.

An α-ray measuring method comprising the steps of:

• detecting α-rays using a plurality of semiconductor detectors arranged on a plane surface;
• adding output signals from said respective semiconductor detectors;
• anticoincidently counting the output signals from said respective semiconductor detectors;
• and
• analyzing an energy distribution of the α-rays based on an addition of the output signals from said semiconductor detectors which are not anticoincidently countered.

An α-ray measuring method comprising the steps of:

• detecting α-rays using a plurality of semiconductor detectors arranged one above another;
• adding output signals from said respective semiconductor detectors;
• anticoincidently counting the output signals of said respective semiconductor detectors;
• and
• analyzing an energy distribution of the α-rays based on an addition of the output signals from said semiconductor detectors which are not anticoincidently countered.

An α-ray measuring method comprising the steps of:

• detecting α-rays using a plurality of semiconductor detectors arranged on plane surfaces placed one above another;
• adding output signals from said respective semiconductor detectors on each of said plane surfaces;
• anticoincidently counting the output signals from said respective semiconductor detectors on said respective plane surfaces;
• and
• analyzing an energy distribution of the α-rays based on an addition of the output signals from said semiconductor detectors on each of said plane surface which are not anticoincidently countered.