Interdigitated capacitor structure for an integrated circuit
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsTse-Lun Tsai, Yu-Tai Chia, JC Guo
Life of this patent
Estimating the term…
Loading patent…
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsTse-Lun Tsai, Yu-Tai Chia, JC Guo
Estimating the term…
The present invention provides a capacitor structure for an integrated circuit comprising at least two layers of substantially parallel interdigitated strips wherein the strips of each layer are alternately connected to a first bus and a second bus. The first and the second bus of each layer are respectively interconnected to the first and second bus of an adjacent layer. The strips of each layer are oriented approximately perpendicular to the strips of an adjacent layer. The capacitor structure further comprises dielectric material between strips of the same and different layers. Further, the present invention includes a method of fabricating the capacitor structure. The method comprises forming at least two layers of substantially parallel interdigitated strips which are alternately connected to a first bus and a second bus of each layer. Respectively connecting the first and the second bus of each layer to the first and the second bus of an adjacent layer. Orienting the strips of one layer approximately perpendicular to the strips of an adjacent layer. And, forming dielectric material between strips of the same and different layers.
A method of fabricating a capacitor structure for an integrated circuit, comprising:
A capacitor structure for an integrated circuit comprising:
Dependencies are inferred from the claim text.