Structures useful in electron beam lithography
AssigneeApplied Materials, Inc.
InventorsCheng Guo, Stephen Moffatt
Life of this patent
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Abstract
A method for forming a mask assembly for use in lithography, typically electron-beam lithography, first forms in a substrate one half of a plurality of opening therethrough and then fills the openings with a removable fill material. Thereafter are formed the other half of the openings which are then filled with the removable fill material. After all the openings have been formed and filled, a support membrane is formed over the substrate and covers the filled windows. A mask layer is then formed over the membrane and patterned. The fill is then removed from all of the windows.
Claims46
A method for forming a mask assembly for use in lithography comprising the steps of:
- forming a support structure that comprises a substrate that includes a plurality of windows filled with a temporary fill;
- forming over the filled-windowed substrate a mask;
- and
- removing the temporary fill.
A method for forming a mask assembly for use in lithography comprising the steps of:
- forming a support structure that comprises a substrate that includes a plurality of windows filled with a temporary fill;
- forming over the filled-windowed substrate a membrane layer for supporting the mask layer;
- and
- forming a mask layer over the membrane layer;
- and
- removing the temporary fill.
A method of forming a mask assembly comprising the steps of:
- forming in a substrate a support structure, which includes major and minor struts that define an array of windows in a two-dimensional array of rows and columns, by successive rounds of cutting in the substrate a fraction of the total window area to be formed;
- filling such fraction of windows with temporary fill before the succeeding round of cutting and filling until all the window areas are cut and filled;
- forming a membrane layer over a top surface of the support structure;
- forming a mask layer over the membrane layer;
- and
- removing the fill from the windows.
A method of forming a mask assembly for use in electron beam lithography comprising the steps of:
- forming in a substrate a first set of spaced-apart windows;
- filling the windows with a temporary fill;
- forming in the substrate a second set of windows in the spaces between the first set of windows for forming with the first set a two-dimensional array of windows arranged in row and columns;
- filling the second set of windows with a temporary fill;
- depositing over the filled-windowed substrate a layer suitable for supporting a mask;
- depositing over the last-mentioned layer a layer suitable for providing a mask;
- patterning the last-mentioned layer to form a mask, and
- removing the temporary fill from the windows, whereby the mask layer is free of underlying substrate.
A method for forming a mask assembly comprising the steps of:
- forming by use of a mold a support structure that defines an array of windows arranged in rows and columns;
- filling the openings with a temporary fill;
- forming over the support structure a membrane layer;
- forming over the membrane layer a patterned mask;
- and
- removing the temporary fill.
A method of forming a mask support structure comprising the steps of:
- forming in a substrate a first set of spaced apart windows;
- filling the first set of windows with a temporary fill;
- forming in the substrate a second set of windows located in portions of the substrate between the first set of filled windows;
- and
- filling the second set of windows with a temporary fill.
A method of forming a mask support structure comprising the steps of:
- placing in a mold which is shaped to facilitate the formation of a support structure a plurality of parallel minor struts;
- forming in the mold a mask support structure that comprises a frame and plurality of major struts that are orthogonal and attached to the minor struts with the major and minor struts defining a plurality of windows arranged in a two dimensional array of rows and columns;
- and
- filling the windows with a temporary fill.
Dependencies are inferred from the claim text.