System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process
AssigneeYieldBoost Tech, Inc.
InventorKyo Young Chung
Life of this patent
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Abstract
A system and method of monitoring LCD production yields, predicting the effects of different testing methodologies on LCD production yields, and optimizing production yields is provided that compares the effect of different testing methodologies on the yields at various stages in the LCD testing and assembly process. The present invention can also be used to predict the effect of different testing methodologies on user-defined parameters, such as profit.
Claims25
A method of improving a defect detection efficiency of a test recipe used to evaluate electrode array panels, wherein the test recipe comprises pixel driving signals applied to the electrode array panels that generate pixel voltages, and thresholding parameters applied to the pixel voltages to determine if a pixel is defective, the method comprising:
- determining if a process abnormality occurred during a manufacturing process for the electrode array panel;
- and
- adjusting the thresholding parameters based on the existence of a process abnormality during the manufacturing process.
A method of improving a defect detection efficiency of a test recipe used to evaluate electrode array panels, wherein the test recipe comprises pixel driving signals applied to the electrode array panels that generate pixel voltages, and thresholding parameters applied to the pixel voltages to determine if a pixel is defective, the method comprising:
- measuring the pixel voltages;
- identifying pixel voltages that deviate from a mean normal pixel voltage value;
- and
- adjusting the thresholding parameters based on the pixel voltages that deviate from the mean normal pixel voltage.
A method of improving a defect detection efficiency of a test recipe used to evaluate electrode array panels, wherein the test recipe comprises pixel driving signals applied to the electrode array panels that generate pixel voltages, and thresholding parameters applied to the pixel voltages to determine if a pixel is defective, the method comprising:
- determining a probability that a defect is present in the electrode array panel;
- and
- adjusting the thresholding parameters based on the determined probability.
An article of manufacture, comprising:
- a computer usable medium having computer readable program code embodied therein for improving a defect detection efficiency of a test recipe used to evaluate electrode array panels, wherein the test recipe comprises pixel driving signals applied to the electrode array panels that generate pixel voltages, and thresholding parameters applied to the pixel voltages to determine if a pixel is defective, the computer readable program code in the article of manufacture causing a computer to:
- determine a probability that a defect is present in the electrode array panel;
- and
- adjust the thresholding parameters based on the determined probability.
A program storage device readable by a machine, tangibly embodying a program of instructions executable by the machine to perform method steps for improving a defect detection efficiency of a test recipe used to evaluate electrode array panels, wherein the test recipe comprises pixel driving signals applied to the electrode array panels that generate pixel voltages, and thresholding parameters applied to the pixel voltages to determine if a pixel is defective, the method comprising:
- determining a probability that a defect is present in the electrode array panel;
- and
- adjusting the thresholding parameters based on the determined probability.
A defect detection system used to evaluate electrode array panels, wherein the system applies pixel driving signals applied to the electrode array panels that generate pixel voltages, and initial thresholding parameters applied to the pixel voltages to determine if a pixel is defective, the method comprising:
- an array test stage for applying pixel driving signals to the electrode array panels, and for measuring pixel voltages generated in response to the pixel driving signals, wherein the array test stage comprises a processor for:
- applying thresholding parameters to the pixel voltages to determine if a pixel is defective,
- identifying pixel voltages that deviate from a mean normal pixel voltage value, and
- adjusting initial thresholding parameters based on the pixel voltages that deviate from the mean normal pixel voltage.
Dependencies are inferred from the claim text.